Ironloss of silicon steel sheet test is silicon steel sheet production, circulation and use of quality management are important evaluation index of silicon steel sheet. According to the test can determine the quality of silicon steel sheet material, early detection of material defects, to the motor, transformers and related quality management bring great convenience.
According to the industry standard ( GB / 3655-2000 ), using the Epstein circle as the testing and evaluation of iron loss of silicon steel sheet on the basis of this method, the international IEC standards and national standards recommend the use of methods.
GM300SST LOSSMETER uses magnetic conductance meter design and tested in full compliance with international standards, make the test results more accurate, suitable for testing all the specifications of the product. Depth development, configuration with micro square circle ( according to the international standard gauge of Epstein ring the scaled down ), with the computer via MS232 interface connection, can completely replace silicon steel measuring device, to achieve all the parameters measurement of silicon steel. For small and medium sized users as well as the silicon source samples less the more high precision measurement, saving more than 60% spending, directly using the magnetic measurement of much cheaper, more convenient to use.
Introduced the principle and the depth development
In order to solve the problems of loss measuring instrument, TinDun Industry (ShangHai) Co.,Ltd in reference to Mei Wen Yu's" magnetic measurement" writings, completely according to the industry standard ( GB / 3655-2000 ) requirements, design and production of the FE-30SST LOSSMETER silicon steel sheet iron loss measuring instrument. Apparatus using closed circuit camera complete reference GB requirements, an excitation coil and induction coils are wound on the tested silicon steel sheet, at the same time, in accordance with the requirements of GB on the air compensating coil production ( air induction compensation to 0.1mV below ), also adopted two analog-to-digital conversion of voltage and current are real sample, reached on all samples accurate measurement, testing accuracy is basically close to the GB / 3655-2000 standard requirements.
At the same time, because the product is a complete set of closed loop feedback test system, the internal of voltage, current and actual waveform and phase of complete sampling, through the MS232 interface with the computer complete communication, such as the depth of development, can measure the silicon needed a full performance parameters, including: Ps 、Bm。
GM300SST measuring instrument technical indicators
Power supply technology index:
1,frequency: 1, 50Hz / 60Hz, accuracy: 0.05%;
2,power: 20V / 1.5A ( peak power ), accuracy: 0.1%.
30SST ( used in accordance with the national side ring samples for comparison )
1, suitable for sample: length≥120mm, width: 20mm to 30mm; thickness: 0.1mm to 1.0mm.
2, equipped with magnetic conductance of samples for measurement:
1), total loss ratio measurement: Ps 0.1T to1.9T , accuracy: 2.5%;
2), magnetic induction Bm value setting range: 0.5T-1.9T, accuracy: 2.0%;
3),field strength Hm value setting range: 100A/m to 10000A / m, accuracy of 2.5%.